Sensitivity of an Atomic Force Microscope Cantilever with a Crack

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Sensitivity of an Atomic Force Microscope Cantilever with a Crack

The atomic force microscope (AFM) has become an essential tool for the measurement of surface characteristics of diverse materials on a microand nanoscale level [1]. The resolution of measurements for the AFM cantilever is related to its vibration sensitivity. Many researchers have much interest in studying the resonant frequency and sensitivity analysis of AFM cantilevers [2 4]. Cracks may be ...

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Sensitivity analysis of a caliper formed atomic force microscope cantilever based on a modified couple stress theory

A relationship based on the modified couple stress theory is developed to investigate the flexural sensitivity of an atomic force microscope (AFM) with assembled cantilever probe (ACP). This ACP comprises a horizontal cantilever, two vertical extensions and two tips located at the free ends of the extensions which form a caliper. An approximate solution to the flexural vibration problem is obta...

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Scanned-cantilever atomic force microscope

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ژورنال

عنوان ژورنال: Microscopy and Microanalysis

سال: 2014

ISSN: 1431-9276,1435-8115

DOI: 10.1017/s143192761401143x